Microelectronics Journal · 2006 · 148 citations · 1 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsCarrier TransportDevice CharacterizationElectrical CharacterizationSemiconductor PhysicsSemiconductor Thin FilmsThin Film Electrical PropertiesHot Carrier DynamicsImpuritiesSemiconductor CharacterizationSemiconductor Device CharacterizationSemiconductor MetrologyThin-film Semiconductors
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