Journal of the American Chemical Society · 2000 · 137 citations · 23 references
Natural SciencesChemistryMaterials ScienceMaterials ChemistrySurface ChemistrySurface ScienceSemiconductor SurfacesSurface CharacterizationSurface ModificationSurface OxidationSurface PassivationSurface PhysicsIndium Tin Oxide Thin FilmsSurface Defect CharacterizationSurface Oxide FormationThin Oxide FilmsTin OxidesTin-doped Indium Oxide
ADVERTISEMENT RETURN TO ISSUEPREVCommunicationNEXTSurface Characterization and Modification of Indium Tin Oxide in Ultrahigh VacuumKathleen L. Purvis, Gang Lu, Jeffrey Schwartz, and Steven L. BernasekView Author Information Department of Chemistry, Princeton University Princeton, New Jersey 08544-1009 Cite this: J. Am. Chem. Soc. 2000, 122, 8, 1808–1809Publication Date (Web):February 15, 2000Publication History Received11 August 1999Published online15 February 2000Published inissue 1 March 2000https://pubs.acs.org/doi/10.1021/ja992910qhttps://doi.org/10.1021/ja992910qrapid-communicationACS PublicationsCopyright © 2000 American Chemical SocietyRequest reuse permissionsArticle Views1722Altmetric-Citations122LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-AlertscloseSupporting Info (1)»Supporting Information Supporting Information SUBJECTS:Binding energy,Oxides,Thin films,Ultrahigh vacuum,X-ray photoelectron spectroscopy Get e-Alerts
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