Bulletin of Materials Science · 2008 · 52 citations · 13 references
Natural SciencesMaterials SciencePhysicsOptical MaterialsOpticsThin FilmsOptical Properties Of MaterialsOptical Properties Of SolidsOptical Thin FilmsThin Film Electrical PropertiesThin Film Optical PropertiesThin-film MaterialsAnisotropic Electrical PropertiesElectrical PropertiesElectrical Properties AnalysisOptical Thin Film CharacterizationTellurium Chemistry
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A.P. Mirgorodsky, Thérèse Merle‐Méjean, J.-C. Champarnaud et al. · Journal of Physics and Chemistry of Solids · 2000 · 173 citations
Influence of γ radiation on thin Ta2O5–Si structures
E. Atanassova, A. Paskaleva, D. Spassov et al. · Microelectronics Journal · 2001 · 90 citations
Natural Sciences, Materials Engineering, Materials Science +17