Concepedia

Shallow surface etching of organic and inorganic compounds by electrospray droplet impact

Kenzo Hiraoka, Yuji Sakai, Yoshitoki Iijima, Daiki Asakawa, Kunihiko Mori

Applied Surface Science · 2009 · 30 citations · 16 references

DOI

Concepts

References

16

Handbook of X-Ray Photoelectron Spectroscopy

J. F. Moulder · Medical Entomology and Zoology · 1995 · 23.7K citations

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A C<sub>60</sub> Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer et al. · Analytical Chemistry · 2003 · 539 citations

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Fundamental aspects of electrospray droplet impact/SIMS

Kenzo Hiraoka, Kunihiko Mori, Daiki Asakawa · Journal of Mass Spectrometry · 2006 · 110 citations

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Electrosprayed droplet impact/secondary ion mass spectrometry

Kenzo Hiraoka, Daiki Asakawa, Susumu Fujimaki et al. · The European Physical Journal D · 2005 · 95 citations

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Structural investigation of keV Ar-ion-induced surface ripples in Si by cross-sectional transmission electron microscopy

Tapas Kumar Chini, F. Okuyama, Masaki Tanemura et al. · Physical review. B, Condensed matter · 2003 · 90 citations · Full text

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