J. F. Moulder - Concepedia

Author

J. F. Moulder

PerkinElmer (United States)

Also Known As

J Moulder, J. F. MOULDER, J. F. Moulder, J. Moulder, J.F. Moulder, John F. Moulder, John Moulder, John. F. Moulder

Publications

27.8K

Citations

H-Index

Concepts

All Affiliations

PerkinElmer (United States)Applied Physical Electronics (United States)

About

J. F. Moulder is an author at PerkinElmer (United States) specializing in engineering, materials science, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	15	24.2K
2	Applied Physics	9	9	23.9K
3	Natural Sciences	4	4	23.8K
4	Chemical Engineering	3	3	166
5	Education	1	1	67

J. F. Moulder

Publications

24.4K

Citations

H-Index

Page 1

	Year	Citations
Handbook of X-Ray Photoelectron Spectroscopy J. F. Moulder Medical Entomology and Zoology X-ray SpectroscopyEngineeringPhysicsNatural SciencesSpectroscopy	1995	23.7K
Static secondary ion mass spectrometry of adsorbed proteins David S. Mantus, Buddy D. Ratner, Brad A. Carlson, Analytical Chemistry	1993	194
XPS and SIMS Study of Anhydrous HF and UV/Ozone‐Modified Silicon (100) Surfaces Larry Zazzera, J. F. Moulder Journal of The Electrochemical Society EngineeringOptoelectronic DevicesIntegrated CircuitsChemistryAnhydrous Hf	1989	86
Angular resolved x-ray photoelectron spectroscopy study of reactively sputtered titanium nitride C. Ernsberger, J. T. R. Nickerson, A. E. Miller, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceMaterials EngineeringO2 LevelsX-ray SpectroscopyEngineering	1985	76
Using angle resolved ESCA to characterize Winchester disks J. F. Moulder, John Hammond, K.L. Smith Applied Surface Science Winchester DisksPrecision MeasurementEngineeringPhysicsMeasurement	1986	67
High Resolution XPS Spectrum of Calcite (CaCO3) Donald R. Baer, J. F. Moulder Surface Science Spectra X-ray SpectroscopyClean Calcite SurfaceEngineeringElectron Flood GunSoil Mineralogy	1993	52
The role of copper in ZnO/Cu/ZnO thin films for flexible electronics K. Sivaramakrishnan, N. David Theodore, J. F. Moulder, Journal of Applied Physics Optical MaterialsEngineeringMetallic NanomaterialsThin Film Process TechnologyBand Gap	2009	50
Composition depth profiles of oxidized silicon and sputtered GaAs from angle-resolved x-ray photoelectron spectroscopy T. D. Bussing, P. H. Holloway, Y. X. Wang, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena EngineeringSilicon On InsulatorSemiconductor DeviceSemiconductorsLaplace Transforms	1988	39
C60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentation Gregory L. Fisher, Michelle Dickinson, Scott R. Bryan, Applied Surface Science Materials EngineeringMaterials ScienceEngineeringNanomaterialsOrganic Electronics	2008	33
Study on the interaction between Ag and tris(8‐hydroxyquinoline) aluminum using x‐ray photoelectron spectroscopy Weijie Song, Shu Kong So, J. F. Moulder, Surface and Interface Analysis Aluminium NitrideEngineeringOrganic Electronics/Indium Tin OxideAlq 3	2001	28

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