Chinese Science Bulletin · 2013 · 12 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsMaterials ChemistryThin FilmsOxide SemiconductorsSurface PhysicsThin Film Surface MorphologyThin-film DepositionThin-film MaterialsAmbient Pressure EffectsFilm Growth MechanismsOxide Growth KineticsPulsed Laser DepositionSubstrate Temperature EffectsThin Oxide FilmsThin-film Growth KineticsThin-film Growth Mechanisms
Ba(Fe 1/2 Nb 1/2 )O 3 thin films were grown on Pt/TiO 2 /SiO 2 /Si substrates with pulsed laser deposition (PLD) at temperatures ranging from 823 to 923 K with the varied ambient oxygen pressure. X-ray diffraction (XRD) data confirmed the single phase of polycrystalline Ba(Fe 1/2 Nb 1/2 )O 3 thin films. The effects of substrate temperature and ambient oxygen pressure on the surface morphologies of the thin films were investigated by atomic force microscopy (AFM) and the growth dynamics of thin films was discussed. Larger grains and denser surface morphologies were observed with increasing substrate temperature. While finer grains were produced with increasing ambient oxygen pressure due to more frequent collisions between the ejected species and ambient oxygen molecules. The influence of the substrate temperature and ambient oxygen pressure on the dielectric properties was also discussed. Improved dielectric constant and decreased dielectric loss was observed for the thin film deposited at evaluated temperature.
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Optical Response of High-Dielectric-Constant Perovskite-Related Oxide
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Origin of apparent colossal dielectric constants
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Natural Sciences, Materials Engineering, Materials Science +15