Concepedia

In situ electron backscatter diffraction (EBSD) during the compression of micropillars

Christoph Niederberger, William Mook, Xavier Maeder, Johann Michler

Materials Science and Engineering A · 2010 · 45 citations · 32 references

DOIFull text

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References

32

Sample Dimensions Influence Strength and Crystal Plasticity

Michael D. Uchic, Dennis M. Dimiduk, J.N. Florando et al. · Science · 2004 · 2.3K citations

, , +17

Size effects in the deformation of sub-micron Au columns

Cynthia A. Volkert, Erica T. Lilleodden · The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics · 2006 · 715 citations · Full text

, , +17

Scanning Electron Microscopy and X-Ray Microanalysis

Gerhard Eisenbeis · Micron · 2003 · 700 citations

, , +12

High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

A.J. Wilkinson, Graham Meaden, D. J. Dingley · Ultramicroscopy · 2005 · 677 citations

, , +16

Microtexture determination by electron back-scatter diffraction

D. J. Dingley, Valerie Randlè · Journal of Materials Science · 1992 · 403 citations

, , +13