Current-Induced Degradation of Nickel Ohmic Contacts to SiC - Concepedia

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Current-Induced Degradation of Nickel Ohmic Contacts to SiC

20

Citations

11

References

2009

Year

Brian P. Downey, J. R. Flemish, Boju Liu, Trevor Clark, Suzanne E. Mohney

Journal of Electronic Materials

Electrical EngineeringEngineeringCurrent-induced DegradationApplied PhysicsCarbide

References

	Year	Citations

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