Applied Physics Letters · 1980 · 116 citations · 7 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials PhysicsMetallic MaterialsSolid State PhysicsAmorphous MaterialsAmorphous SolidsDiffusion In SolidsMetalsThin Film AnnealingThin Film DiffusionActivation EnergyAnnealing EffectsAnnealing Time EffectsDiffusion During AnnealingDiffusivityStructural DefectsStructural RelaxationViscosity
The interdiffusivity in compositionally modulated (λ≈25 Å) amorphous (Pd85Si15)61/(Fe85B15)89 and (Pd80Au7Si13)70/Fe30 films has been measured by monitoring the satellite of the (000) x-ray scattering peak during isothermal anneals in the range 210–250 °C. Diffusivities as low as 10−22 cm2 s−1 have been measured. It was observed that the diffusivity decreased continuously during the annealing as a result of structural relaxation and settled down to a constant value only after many hours of annealing. The activation energy of the isoconfigurational diffusivity in the Pd-Au-Si/Fe films is 167 kJ mol−1. This value and the time scale of the relaxation are similar to those observed in earlier viscosity measurements, indicating a similarity between the structural defects controlling both transport processes.
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Isoconfigurational flow of amorphous Pd82Si18
Alan Taub, F. Spaepen · Scripta Metallurgica · 1979 · 178 citations
Natural Sciences, Materials Engineering, Materials Science +5
Diffusion in a Pd-Cu-Si metallic glass
H. S. Chen, Lionel C. Kimerling, J. M. Poate et al. · Applied Physics Letters · 1978 · 177 citations