Publication | Closed Access
Analysis of Structural Defects in the 4H-SiC Epilayers and their Influence on the Electrical Properties
12
Citations
4
References
2004
Year
Materials EngineeringMaterials ScienceElectrical EngineeringEngineeringPower DeviceNanoelectronicsApplied Physics4H-sic EpilayersStructural DefectsDefect FormationStructural CeramicElectrical PropertiesCarbide
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