Publication | Closed Access
Failure mechanisms of solder interconnects under current stressing in advanced electronic packages
271
Citations
109
References
2010
Year
Electrical EngineeringReliability EngineeringEngineeringAdvanced Packaging (Semiconductors)Hardware ReliabilitySolid MechanicsFailure MechanismsElectronic PackagingDevice ReliabilityMicroelectronicsCurrent StressingMechanics Of MaterialsPhysic Of FailureAdvanced Electronic Packages
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