Publication | Closed Access
A two-dimensional model of the avalanche effects in MOS transistors
57
Citations
10
References
1982
Year
Device ModelingElectrical EngineeringEngineeringPhysicsNanoelectronicsElectronic EngineeringAvalanche EffectsApplied PhysicsCondensed Matter PhysicsBias Temperature InstabilitySemiconductor Device
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