Field-ion specimen preparation using focused ion-beam milling - Concepedia

Concepedia

Publication | Closed Access

Field-ion specimen preparation using focused ion-beam milling

257

Citations

15

References

1999

Year

David J. Larson, D. T. Foord, A. K. Petford‐Long, Hans Liew, M. G. Blamire, A. Cerezo, George Smith

Ultramicroscopy

Materials ScienceIon ImplantationField-ion Specimen PreparationEngineeringMicroscopyMicrofabricationApplied PhysicsIon BeamInstrumentation

References

	Year	Citations

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