A. Cerezo

Atomic scale structure of sputtered metal multilayers

Xiaowang Zhou, H.N.G. Wadley, R. A. Johnson et al. · Acta Materialia · 2001 · 789 citations

Natural Sciences, Materials Engineering, Materials Science +14

A procedure for quantification of precipitate microstructures from three-dimensional atom probe data

D. Vaumousse, A. Cerezo, P.J. Warren · Ultramicroscopy · 2003 · 366 citations

Natural Sciences, Materials Engineering, Materials Science +10

Multiple hit readout of a microchannel plate detector with a three-layer delay-line anode

O. Jagutzki, A. Cerezo, A. Czasch et al. · IEEE Transactions on Nuclear Science · 2002 · 358 citations

Engineering, Electrical Engineering, Instrumentation +13

Application of a position-sensitive detector to atom probe microanalysis

A. Cerezo, T. J. Godfrey, G.D.W. Smith · Review of Scientific Instruments · 1988 · 333 citations

Engineering, Materials Engineering, Materials Science +13

Three-dimensional atomic-scale mapping of a cottrell atmosphere around a dislocation in iron

J. A. de Wilde, A. Cerezo, George David Smith · Scripta Materialia · 2000 · 281 citations

Natural Sciences, Materials Engineering, Physics +9