Structural investigations of Ge nanoparticles embedded in an amorphous SiO2 matrix

Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

C. D. Wagner, Lawrence E. Davis, M. Zeller et al. · Surface and Interface Analysis · 1981 · 2K citations

Engineering, Sensitivity Factors, Chemical Analysis +18

Reevaluation of X-Ray Atomic Energy Levels

J. Bearden, A. F. Burr · Reviews of Modern Physics · 1967 · 2K citations

X-ray Spectroscopy, Engineering, Physics +10

Electronegativity is the average one-electron energy of the valence-shell electrons in ground-state free atoms

Leland C. Allen · Journal of the American Chemical Society · 1989 · 812 citations

Electron Density, Engineering, Physics +15

dc bias-induced dielectric anomalies in -oriented 0.9Pb(Mg[sub ⅓]Nb[sub ⅔]O₃)-0.1PbTiO₃ single crystals

Jie Wang, Yanmin Jia, Rongkun Zheng et al. · Applied Physics Letters · 2006 · 738 citations

Single Crystals, Engineering, Crystalline Defects +9

Visible photoluminescence of Ge microcrystals embedded in SiO2 glassy matrices

Yoshihito Maeda, Nobuo Tsukamoto, Y. Yazawa et al. · Applied Physics Letters · 1991 · 602 citations · Full text

Optical Materials, Engineering, Luminescent Glass +17