M. Zeller - Concepedia

Concepedia

Author

M. Zeller

University of Notre Dame

Also Known As

M ZELLER, M. V. ZELLER, M. V. Zeller, M. Zeller, M.V. Zeller, MARY V. ZELLER, MARY ZELLER, Mary V. Zeller, Zeller, M.

106

Publications

2.7K

Citations

15

H-Index

58

Concepts

All Affiliations

University of Notre Dame Glenn Research Center Saint Mary's College PerkinElmer (United States)

MZ

About

M. Zeller is an author at University of Notre Dame specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	15	2.6K
2	Applied Physics	10	10	2.3K
3	Natural Sciences	3	3	2.2K
4	Medicine	2	2	43
5	Health Sciences	1	1	109

M. Zeller

×

18

Publications

2.7K

Citations

15

H-Index

	Year	Citations
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis C. D. Wagner, Lawrence E. Davis, M. Zeller, Surface and Interface Analysis EngineeringSensitivity FactorsChemical AnalysisAtomic Emission SpectroscopyComputational Chemistry	1981	2K
Photoelectron spectroscopy of tin compounds Paul A. Grutsch, M. Zeller, Thomas P. Fehlner Inorganic Chemistry EngineeringInorganic PhotochemistryAltmetric Attention ScoreBibliometricsOrganic Chemistry	1973	141
X-ray photoelectron spectroscopic studies on the electronic structures of porphyrin and phthalocyanine compounds M. Zeller, Robert G. Hayes Journal of the American Chemical Society EngineeringChemical AnalysisAltmetric Attention ScoreOrganic ChemistryChemistry	1973	109
The correlation of chemical structure and electrical conductivity in polypyrrole films by x‐ray photoelectron spectroscopy M. Zeller, Stephen J. Hahn Surface and Interface Analysis EngineeringElectrode-electrolyte InterfaceMedium Current DensitiesChemistryPolypyrrole Films	1988	45
Surface Chemistry of Perfluoro Ethers: An Infrared Study of the Thermal Decomposition of (C2F5)2O on Al2O3 Lily Ng, E. Lyth, M. Zeller, Langmuir EngineeringAltmetric Attention ScoreOrganic ChemistryChemistryApplied Chemistry	1995	39
Scanning tunneling microscope tip structures Ruth Nicolaides, Yong Liang, William E. Packard, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceMaterials EngineeringSurface CharacterizationEngineeringTunneling Microscopy	1988	39
Auger and infrared study of polypyrrole films: Evidence of chemical changes during electrochemical deposition and aging in air Stephen J. Hahn, Walter J. Gajda, P. O. Vogelhut, Synthetic Metals Materials ScienceConducting PolymerChemical EngineeringEngineeringPolypyrrole Films	1986	38
High Frequency Capacitance‐Voltage Characteristics of Thermally Grown SiO2 Films on β ‐ SiC S. M. Tang, W.B. Berry, R. Kwor, Journal of The Electrochemical Society EngineeringThin Film Process TechnologySemiconductor DeviceSemiconductorsMaterials Engineering	1990	36
Surface modification strategies for (100)3C-SiC J. J. Bellina, John Ferrante, M. Zeller Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceMaterials EngineeringElectrical EngineeringSurface CharacterizationEngineering	1986	35
Stoichiometric changes in the surface of (100) cubic SiC caused by ion bombardment and annealing J. J. Bellina, M. Zeller Applied Surface Science Materials ScienceMaterials EngineeringIon ImplantationEngineeringCeramic Material	1986	30

Page 1