Atomic-force microscopy on the Si(111)7×7 surface

Abstract

Force-microscopy measurements are performed on the Si(111) surface. The 7\ifmmode\times\else\texttimes\fi{}7 reconstruction is observed in the repulsive contact mode. With applied contact pressures of 1--10 GPa the reconstructed surface remains stable. Variations of frictional forces of the order of ${10}^{\mathrm{\ensuremath{-}}9}$ N are observed on the atomic scale.