Publication | Closed Access
Strain-dependent electrical resistance of tin-doped indium oxide on polymer substrates
605
Citations
5
References
2000
Year
EngineeringMechanical EngineeringCracked Ito LayerThin Film Process TechnologyConducting LayerElectronic PackagingThin Film ProcessingMaterials ScienceTensile StrainElectrical EngineeringOxide ElectronicsElectrical PropertyStrain-dependent Electrical ResistanceSpecific ResistanceElectronic MaterialsSemiconducting PolymerApplied PhysicsMaterial PerformanceThin FilmsMechanics Of MaterialsElectrical Insulation
The increase in sheet resistance of indium–tin–oxide (ITO) films on polyethylene terephthalate with increasing tensile strain is reported. The increase in resistance is related to the number of cracks in the conducting layer which depends upon applied strain and film thickness. We propose a simple model that describes the finite but increasing resistance in the cracked ITO layer in terms of a small volume of conducting material within each crack.
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