physica status solidi (b) · 1983 · 24 citations · 10 references
EngineeringIntrinsic RecombinationChemistrySemiconductorsIi-vi SemiconductorQuantum MaterialsMolecular Beam EpitaxyCompound SemiconductorMaterials ScienceExcitation Level ApplicationPhysicsCrystalline DefectsCrystal MaterialLimit δNAuger Transition RateSemiconductor MaterialMixed CrystalsCrystallographySolid-state PhysicTransition Metal ChalcogenidesNatural SciencesApplied PhysicsCondensed Matter Physics
Abstract On the base of anisotropic and parabolic band structure recombination rates are calculated for the mixed crystals Pb 0.78 Sn 0.22 Te and PbS 0.1 Se 0.9 in dependence on non‐equilibrium carrier concentration δ n up to 10 20 cm −3 in a wide range of temperatures and doping levels. Degeneracy causes different changes of lifetimes or recombination rates for material with different activation energies of the recombination process. Both, weakening or strengthening of the known n 2 p ‐law of the Auger transition rate can occur at beginning degeneracy. At δn > 10 19 cm −3 always sublinear behaviour should be observed. For radiative recombination a weakening of the np ‐law is obtained generally; in the limit δn > 10 19 cm −3 the rate behaves like ( δn ) 4/3 .
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Recent advances in lead-chalcogenide diode lasers
H. Preier · Applied Physics A · 1979 · 383 citations
Carrier density dependence of Auger recombination
Albert Haug · Solid-State Electronics · 1978 · 115 citations
Nonradiative and Radiative Recombination in Lead Chalcogenides
O. Ziep, D. Genzow, M. Mocker et al. · physica status solidi (b) · 1980 · 43 citations
Semiconductors, Spontaneous Emission, Ii-vi Semiconductor +15
Life time measurements in PbTe and PbSnTe
B. Schlicht, Ralf Dornhaus, G. Nimtz et al. · Solid-State Electronics · 1978 · 35 citations
Measurement, Bias Temperature Instability, Applied Physics +3