IEEE Journal of Quantum Electronics · 1989 · 17 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesHigh-frequency Semiconductor DevicesLaser DiodesLaser PhysicsNoise In Semiconductor DevicesPhotonic Integrated CircuitsSemiconductor LasersDiode Laser Threshold CurrentLasersLow-pressure Chemical Vapor DepositionLow-threshold Current LasersMetalorganic Chemical Vapor DepositionSemiconductor Laser DiodesSingle-mode OperationThreshold Behavior
GaInAsP/InP distributed-feedback (DFB) buried-ridge-structure laser diodes (BRS-LD) emitting at 1.52 mu m have been fabricated on material grown by two-step low-pressure metalorganic chemical-vapor deposition (LP-MOCVD), with a second-order corrugation on the GaInAsP guiding layer. The minimum CW threshold current of 5 mA is believed to be the lowest yet reported for DFB lasers at 1.5 mu m. Single-longitudinal-mode operation with a side mode suppression ratio of 40 dB from 20 to 100 degrees C with a temperature evolution of 0.64 AA/ degrees C has been obtained. At only 20 mA above threshold, a bandwidth of 9.6 GHz and a relative intensity noise (RIN) lower than -150 dB/Hz at 4 GHz have been measured.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Ultra-high speed semiconductor lasers
Kam Y. Lau, A. Yariv · IEEE Journal of Quantum Electronics · 1985 · 237 citations
High-speed InGaAsP constricted-mesa lasers
John E. Bowers, B. R. Hemenway, A.H. Gnauck et al. · IEEE Journal of Quantum Electronics · 1986 · 185 citations
Manijeh Razeghi, R. Blondeau, K. Kaźmierski et al. · Applied Physics Letters · 1984 · 29 citations