Nanotechnology · 2005 · 30 citations · 26 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsSpectroscopySurface ScienceNanomechanical PropertiesSurface SpectroscopyVibrational SpectroscopyDynamic Force SensingDynamic Force SpectroscopyEnergy DissipationForce SpectroscopySiliconTip - Sample InteractionsTip-sample Interactions
Dynamic force spectroscopy experiments were conducted with a silicon tip on graphite in ultrahigh vacuum. Spectroscopy curves were acquired in the constant-amplitude as well as in the constant-excitation mode. From both modes we extract quantitative force and energy dissipation curves. We show that the calculated tip–sample interaction curves are independent of the operational mode. This proves that quantitative dynamic force spectroscopy is also possible in the constant-excitation mode.
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Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
Franz J. Gießibl · Science · 1995 · 1.2K citations · Full text
Energy dissipation in tapping-mode atomic force microscopy
J. P. Cleveland, Boris Anczykowski, A. E. Schmid et al. · Applied Physics Letters · 1998 · 869 citations