Comparative study of quasi-static and normal capacitance–voltage characteristics in amorphous Indium-Gallium-Zinc-Oxide thin film transistors - Concepedia

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Comparative study of quasi-static and normal capacitance–voltage characteristics in amorphous Indium-Gallium-Zinc-Oxide thin film transistors

20

Citations

9

References

2010

Year

Sangwon Lee, Yong Woo Jeon, Sung‐Chul Kim, Dongsik Kong, Dae Hwan Kim

Solid-State Electronics

Materials ScienceDevice ModelingElectrical EngineeringEngineeringOxide ElectronicsApplied PhysicsNormal Capacitance–voltage CharacteristicsThin Film Process TechnologyThin FilmsComparative StudyThin Film ProcessingSemiconductor Device

References

	Year	Citations

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