Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

T. Ben Britton, Claire Maurice, Roland Fortunier, J.H. Driver, A. P. Day, Graham Meaden, D. J. Dingley, Ken Mingard, A.J. Wilkinson

Ultramicroscopy · 2010 · 139 citations · 31 references

Concepts

References

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