Concepedia

Publication | Closed Access

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

DOI

135

Citations

31

References

2010

Year

T. Ben Britton, Claire Maurice, Roland Fortunier, J.H. Driver, A. P. Day, Graham Meaden, D. J. Dingley, Ken Mingard, A.J. Wilkinson
Ultramicroscopy

References

YearCitations

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