A. P. Day

The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

David J. Prior, Alan P. Boyle, Frank E. Brenker et al. · American Mineralogist · 1999 · 689 citations · Full text

Many-beam dynamical simulation of electron backscatter diffraction patterns

Aimo Winkelmann, C. Trager‐Cowan, F. Sweeney et al. · Ultramicroscopy · 2006 · 196 citations

Engineering, Physics, Applied Physics +3

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

T. Ben Britton, Claire Maurice, Roland Fortunier et al. · Ultramicroscopy · 2010 · 135 citations

Engineering, Electron-beam Lithography, Physics +7

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

C. Trager‐Cowan, F. Sweeney, Patrick Trimby et al. · Physical Review B · 2007 · 74 citations

Engineering, Microscopy, Electron Diffraction +16

Rapid Nondestructive Analysis of Threading Dislocations in Wurtzite Materials Using the Scanning Electron Microscope

G. Naresh‐Kumar, B. Hourahine, P. R. Edwards et al. · Physical Review Letters · 2012 · 65 citations