Publication | Closed Access
Observation of the Two-Dimensional Plasmon in Silicon Inversion Layers
612
Citations
21
References
1977
Year
Semiconductor TechnologyPlasmonicsElectron DensityEngineeringMagnetoplasmonicsPhysicsOptical PropertiesNatural SciencesSilicon On InsulatorApplied PhysicsCondensed Matter PhysicsSemiconductor NanostructuresFixed Wave VectorSilicon Inversion LayersNanophotonicsElectron DensitiesPlasmonic Material
The two-dimensional plasmon of an $n$ inversion layer of (100) $p$-type Si is observed at a fixed wave vector as a function of electron density. The position, width, and strength of the resonance agree with existing theory at electron densities \ensuremath{\gtrsim}${10}^{12}$/${\mathrm{cm}}^{2}$. At lower densities, the resonance position is below the predicted value, implying a substantial increase in the electron mass.
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