Publication | Closed Access
Mapping strains at the nanoscale using electron back scatter diffraction
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Citations
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References
2008
Year
EngineeringElectron MicroscopyPhysicsNanomaterialsNanotechnologyMicroscopyScanning Probe MicroscopyApplied PhysicsDiffractionScatter DiffractionMicroanalysisElectron MicroscopeElectron Diffraction
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