Concepedia

Characterization of SiO2/Si interfaces by using X-ray photoelectron spectroscopy time-dependent measurement

Kazuyuki Hirose, Kouhei Sakano, Kazutoshi Takahashi, Takanori Hattori

Surface Science · 2002 · 24 citations · 11 references

DOI

Concepts

References

11

Chemical and electronic structure of the SiO2/Si interface

F. J. Grunthaner, P. J. Grunthaner · Materials Science Reports · 1986 · 448 citations

, , +14

Determination of the Fermi-level pinning position at Si(111) surfaces

F. J. Himpsel, G. Hollinger, R. A. Pollak · Physical review. B, Condensed matter · 1983 · 379 citations

, , +16

Electron−hole pair creation energy in SiO2

G. A. Ausman, F. B. McLean · Applied Physics Letters · 1975 · 172 citations

, , +9

Photoemission-Based Photovoltage Probe of Semiconductor Surface and Interface Electronic Structure

J. E. Demuth, William J. Thompson, N. J. DiNardo et al. · Physical Review Letters · 1986 · 165 citations

, , +15

Chemical Structures of the SiO<sub>2</sub>Si Interface

Takeo Hattori · Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences · 1995 · 118 citations

, , +17