IEEE Electron Device Letters · 2012 · 15 citations · 9 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSensorsCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyCurrent-voltage CharacteristicsIntegrated Circuit DesignMixed-signal Integrated Circuit DesignTransistor BiasingCmos Analog Integrated CircuitsGate-dependent Current-voltage BehaviorNanowire SensorsNanowire TransistorsSensitivitySensor Readout CircuitsSilicon-on-insulator CmosSilicon-on-insulator Technology
We proposed a silicon nanowire (SiNW)-CMOS hybrid common-source amplifier (CSA) as a voltage-readout hydrogen ion sensor and fabricated it on a 6-in silicon-on-insulator wafer using a conventional back-end process and a wafer-level top-down process. The current-defined sensitivity Δ <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">IDS</i> / <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">IDS</i> of the SiNW itself was 0.18, and the maximum output voltage shift found in the CSA configuration was 38.1 mV/pH. A simple analytical model showed that the voltage-defined sensitivity can be controlled and maximized by the gate voltage of the MOSFET, indicating that process variations of SiNWs are electrically controllable in a SiNW-based sensor array system with the voltage-readout scheme.
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