Publication | Open Access
Grain size dependence of the twin length fraction in nanocrystalline Cu thin films via transmission electron microscopy based orientation mapping
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Citations
49
References
2015
Year
Materials ScienceNanoscale ScienceEngineeringNanomaterialsNanotechnologyOrientation MappingApplied PhysicsTwin Length FractionNanometrologyThin FilmsGrain Size DependenceNanocrystalline MaterialThin Film ProcessingMicrostructure
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