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<title>Characterization of an amorphous-silicon fluoroscopic imager</title>
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1997
Year
EngineeringMicroscopyAmorphous-silicon Fluoroscopic ImagerOptical CharacterizationPositron Emission TomographyOptical PropertiesGeneral System ArchitectureRadiologyHealth SciencesMedical ImagingSynthetic Aperture RadarHigh SensitivityDigital ImagingFlat PanelRadiographic ImagingElectronic ImagingMaterials CharacterizationApplied PhysicsBiomedical ImagingAmorphous SolidImaging
This paper describes a dual-mode, flat panel imaging system capable of both fluoroscopy and radiography. Two generations of large area sensing technology are described. The general system architecture incorporates both the high sensitivity and data throughput required for fluoroscopy with the large signal capacity, spatial resolution and form factor necessary for radiography.