Journal of Electronic Materials · 2001 · 18 citations · 26 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice CharacterizationMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky Barrier DiodesSchottky BarriersSilicon Carbide (Sic) Materials
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Statistics of the Recombinations of Holes and Electrons
W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations
Electron-Hole Recombination in Germanium
R. N. Hall · Physical Review · 1952 · 2.7K citations
Cascade Capture of Electrons in Solids
M. Lax · Physical Review · 1960 · 899 citations
Admittance spectroscopy of impurity levels in Schottky barriers
D. L. Losee · Journal of Applied Physics · 1975 · 433 citations