Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces - Concepedia

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Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces

18

Citations

10

References

1984

Year

C. Raisin, E. Vieujot-Testemale, A. Ben Brahim, J.M. Palau, L. Lassabatère

Solid-State Electronics

Materials ScienceWork Function MeasurementsEngineeringNanoelectronicsSurface ScienceApplied PhysicsSiliceneSemiconductor Device FabricationUltra Thin FilmsThin FilmsSilicon On InsulatorCharacterized Silicon SurfacesThin Film Processing

References

	Year	Citations

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