Publication | Closed Access
3D analysis of advanced nano-devices using electron and atom probe tomography
55
Citations
41
References
2013
Year
Materials ScienceEngineeringElectron MicroscopyPhysicsNanomaterialsNanotechnologyMicroscopyNanoelectronicsBiomedical ImagingApplied PhysicsScanning Probe MicroscopyAtomic PhysicsMicroanalysisElectron DiffractionElectron MicroscopeAtom Probe TomographyAdvanced Nano-devices
| Year | Citations | |
|---|---|---|
Page 1
Page 1