Concepedia

Publication | Open Access

TEM/CBED determination of strain in silicon-based submicrometric electronic devices

DOIFull Paper Access

27

Citations

7

References

2000

Year

A. Armigliato, R. Balboni, S. Balboni, Stefano Frabboni, Aude Tixier, G.P. Carnevale, P. Colpani, G. Pavia, Andrea Marmiroli
Micron

References

YearCitations

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