Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements

Atomic Force Microscope

G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.3K citations · Full text

Engineering, Tunneling Microscopy, Physics +14

Fractional Brownian Motions, Fractional Noises and Applications

Benoît B. Mandelbrot, John W. Van Ness · SIAM Review · 1968 · 7.6K citations

Dynamic Scaling of Growing Interfaces

Mehran Kardar, Giorgio Parisi, Yi-Cheng Zhang · Physical Review Letters · 1986 · 5.3K citations

Scaling Analysis, Dynamic Renormalization-group Techniques, Engineering +15

X-ray and neutron scattering from rough surfaces

S. K. Sinha, E. B. Sirota, Stephen Garoff et al. · Physical review. B, Condensed matter · 1988 · 2.4K citations

X-ray Spectroscopy, Engineering, Rayleigh Scattering +16

Anomalous Surface Reflection of X Rays

Yasuharu Yoneda · Physical Review · 1963 · 660 citations

X-ray Crystallography, Crystal Structure, Engineering +16