Dedicated Max-Planck beamline for the <i>in situ</i> investigation of interfaces and thin films

Abstract

A dedicated beamline for the Max-Planck-Institut für Metallforschung was recently taken into operation at the Ångstro/mquelle Karlsruhe (ANKA). Here we describe the layout of the beamline optics and the experimental end-station, consisting of a heavy duty multiple circle diffractometer. For both a new design was realized, combining a maximum flexibility in the beam properties [white, pink, (focused) monochromatic, energy range 6–20 keV] with a special diffractometer for heavy sample environments up to 500 kg, that can be run in different geometrical modes. In addition the angular-reciprocal space transformations for the diffractometer in use are derived, which allows an operation of the instrument in the convenient six circle mode. As an example, results from surface x-ray diffraction on a Cu3Au(111) single crystal are presented.