Journal of Electronic Packaging · 1999 · 15 citations · 17 references
EngineeringComputational EngineeringComputer-integrated ManufacturingManufacturing ProcessesThermal AnalysisDevice CharacterizationDevice ReliabilityFailure AnalysisReliabilityReliability ModelingSemiconductor ReliabilityExperimental TestingFatigue Life PredictionNeural Network ModelingNeutral Network AnalysisProcess ParametersReliability Prediction
In this paper, a methodology, and a program based on the methodology, are presented, which, using the reliability of solder joints for various values of design/process parameters, can be estimated in seconds on a personal computer. The proposed methodology accurately captures the behavior of a solder joint in an artificial neural network (ANN) model trained to relate design as well as analysis parameters to fatigue life. The proposed methodology is novel since such simultaneous analysis and design (SAND) procedures do not appear to have been employed until now for reliability estimation of solder joints. The use of Moire´ interferometry as an experimental technique to estimate the analysis-related inputs to the neutral network model is also presented in the paper. [S1043-7398(00)01101-4]
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Multilayer feedforward networks are universal approximators
Kurt Hornik, Maxwell B. Stinchcombe, Halbert White · Neural Networks · 1989 · 21.2K citations
Multilayer feedforward networks are universal approximators
HornikK., StinchcombeM., WhiteH. · Neural Networks · 1989 · 9.4K citations