Japanese Journal of Applied Physics · 2011 · 22 citations · 18 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureElectronic MaterialsThin FilmsNanostructured Electronic MaterialsOptical Thin FilmsOxide SemiconductorsSemiconductor Thin FilmsThin Film Optical PropertiesCrystal Preferred OrientationCrystallographic Preferred OrientationOptical PropertiesPreferred OrientationResistivityRutile OxidesThin Oxide FilmsTin Oxides
In this study, antimony (6 wt %)-doped tin oxide (ATO) films were prepared on a poly(ether sulphone) (PES) flexible substrate by radio frequency (RF) magnetron sputtering at room temperature, with varying deposition parameters such as RF power and working pressure. The RF power was varied from 50 to 150 W in steps of 25 W. The working pressure was varied from 0.67 to 1.2 Pa in steps of 0.27 Pa at room temperature. The thickness of the deposited ATO films was about 200 nm. The (110), (101), (200), and (211) diffraction peaks were observed for the ATO films deposited with two different conditions. All the samples were found to be crystalline with a cassiterite tetragonal (rutile type) structure that has a preferred orientation in the (101) direction, which is structurally stable and exists mainly in nature. The ATO film deposited at a RF power of 125 W with a working pressure of 0.67 Pa showed the lowest resistivity of 6.9 ×10 -3 Ω cm, and the optical transmittance was 80.1% in the visible wavelength range from 400 to 800 nm.
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Heat mirror coatings for energy conserving windows
Carl M. Lampert · Solar Energy Materials · 1981 · 297 citations