Angular dependence of the ion-induced secondary-electron yield from solids

Abstract

The secondary-electron yield from polycrystalline copper induced by protons, noble-gas ions, and copper ions has been studied as a function of angle of ion incidence in the range 0\ifmmode^\circ\else\textdegree\fi{} to 85\ifmmode^\circ\else\textdegree\fi{}. The experimental results are explained in terms of a recently developed theory for secondary-electron emission. The kinetic emission of electrons is regarded as consisting of two parts which exhibit different dependences on the angle of ion incidence. Good agreement is found between theory and experiment.