Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces - Concepedia

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Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces

19

Citations

9

References

1986

Year

David D. Allred, J. González‐Hernández, On Van Nguyen, D. Martin, D. A. Pawlik

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceEngineeringApplied PhysicsSemiconductor MaterialX-ray Diffraction CharacterizationAmorphous Solid

References

	Year	Citations

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