High-quality epitaxial Bi(111) films on Si(111) by isochronal annealing

The birth of topological insulators

Joel E. Moore · Nature · 2010 · 3.2K citations

Natural Sciences, Materials Science, Physics +12

Calculation of critical layer thickness versus lattice mismatch for Ge<i>x</i>Si1−<i>x</i>/Si strained-layer heterostructures

R. People, J. C. Bean · Applied Physics Letters · 1985 · 1.7K citations

Natural Sciences, Materials Engineering, Materials Science +17

On the stability of surfaces of stressed solids

David J. Srolovitz · Acta Metallurgica · 1989 · 1K citations · Full text

Engineering, Materials Engineering, Materials Science +12

Nanofilm Allotrope and Phase Transformation of Ultrathin Bi Film on Si(111)-7×7

Tadaaki Nagao, Jerzy T. Sadowski, M. Saito et al. · Physical Review Letters · 2004 · 462 citations · Full text

Natural Sciences, Materials Science, Physics +14

The crystal structure of Bi and of solid solutions of Pb, Sn, Sb and Te in Bi

P. Cucka, C. S. Barrett · Acta Crystallographica · 1962 · 343 citations

Natural Sciences, Materials Engineering, Materials Science +14