Publication | Closed Access
An experimental study of data retention behavior in modern DRAM devices
286
Citations
28
References
2013
Year
Unknown Venue
Non-volatile MemoryEngineeringComputer ArchitectureMemory RequestsData Retention BehaviorMemoryDram CellsMemory DeviceMemory DevicesData ManagementModern Dram DevicesElectrical EngineeringComputer EngineeringComputer ScienceMicroelectronicsDram Density IncreasesMemory ReliabilityMemory ArchitectureExperimental StudyResistive Random-access Memory
DRAM cells store data in the form of charge on a capacitor. This charge leaks off over time, eventually causing data to be lost. To prevent this data loss from occurring, DRAM cells must be periodically refreshed. Unfortunately, DRAM refresh operations waste energy and also degrade system performance by interfering with memory requests. These problems are expected to worsen as DRAM density increases.
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