Publication | Closed Access
Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique
109
Citations
37
References
1986
Year
EngineeringVacuum DeviceChemistryCharge TransportElectron SpectroscopyIon EmissionCharge Carrier TransportElectrical EngineeringInduced Surface ConductivityPhysicsSurface-potential StabilizationHigh-resolution Electron-energy-loss SpectroscopyPhysical ChemistryQuantum ChemistryElectrical PropertySurface-potential Stabilization TechniqueElectrochemistryNatural SciencesSpectroscopySurface ScienceCondensed Matter PhysicsApplied PhysicsSurface AnalysisElectrical Insulation
A surface-potential stabilization technique is described which permits one to take vibrational spectra of excellent quality with high-resolution electron-energy-loss spectroscopy on insulating samples of very different types, such as ionic insulators and polymers. Induced surface conductivity and enhanced secondary-electron emission close to the vacuum level are found to be at the origin of the surface-potential stabilization, which is done by irradiation of the sample with electrons in the keV range. Nonequilibrium carrier densities and mean free paths are estimated from observable Drude damping. Irradiation effects are discussed.
| Year | Citations | |
|---|---|---|
Page 1
Page 1