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The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit

Device ModelingElectrical EngineeringEngineeringNanoelectronicsNanotechnologyElectronic EngineeringApplied PhysicsBias Temperature InstabilityHigh-frequency CharacteristicsIntrinsic Parameter FluctuationsMicroelectronicsNano-mosfet DeviceSemiconductor Device