Publication | Closed Access
Effects of the crystallographic orientation of Sn on the electromigration of Cu/Sn–Ag–Cu/Cu ball joints
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Citations
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References
2011
Year
Materials EngineeringMaterials ScienceElectromigration TechniqueEngineeringApplied PhysicsCrystallographic OrientationCu/sn–ag–cu/cu Ball JointsElectrochemical Surface Science
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