Publication | Open Access
A spectroscopic study of GaAs homojunction internal photoemission far infrared detectors
10
Citations
16
References
1997
Year
Optical MaterialsEngineeringFir DetectorsOptoelectronic DevicesInfrared DetectorsSemiconductor NanostructuresSemiconductorsElectronic DevicesOptical PropertiesSpectroscopic StudyInfrared OpticHiwip Fir DetectorsMolecular Beam EpitaxyCompound SemiconductorPhotonicsElectrical EngineeringPhotoluminescencePhysicsInfrared SpectroscopyOptoelectronic MaterialsPhotoelectric MeasurementInfrared SensorNatural SciencesSpectroscopyApplied PhysicsOptoelectronics
We report a spectroscopic study of absorption and photoconductivity in GaAs homojunction interfacial workfunction internal photoemission (HIWIP) far-infrared (FIR) detectors utilizing molecular beam epitaxy (MBE) grown multilayer (p+−p−−p+−p−) structures. Strong FIR (50–200 μm) free carrier absorption has been observed and analyzed for a p+ GaAs thin film, revealing the suitability for FIR detection. The basic physical mechanism of free carrier absorption in the HIWIP FIR detectors has been determined to be an acoustic phonon-emission assisted process. A simple recombination model is proposed to account for the bias dependence of the responsivity and the saturation behavior. Using the measured responsivity and dark current data, detectivity (Dλ∗) of the FIR detectors has also been estimated.
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