Photoelectric Properties of Mg₂Si, Mg₂Ge, and Mg₂Sn I. X‐Ray Excitation

Abstract

Abstract The energy distribution spectra of photoelectrons (XPS) and Auger electrons (AES) excited with AlK α radiation in Mg 2 Si, Mg 2 Ge, and Mg 2 Sn are reported. For the purpose of determining core shifts, measurements were also performed on the elemental constituents. These measurements yield information about the density of valence states, the position and the chemical shifts of the core levels. The energy of the valence plasmons is also obtained. This paper (I) is followed by a second one (II) in which similar results obtained with far UV excitation are reported and discussed in the context of the present work.