Publication | Closed Access
Demonstration of confocal sum frequency microscopy
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Citations
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References
2008
Year
EngineeringMicroscopyOptical MetrologyIntensity ImagesMicroscopy MethodOptical PropertiesComputational ImagingOptical SystemsLight MicroscopyBiophysicsRadiologyPhysicsOphthalmologyMedicineLaser MicroscopyComputational Optical ImagingZns SampleFluorescence MicroscopyMicroscope Image ProcessingSpectroscopyBiomedical ImagingImagingOptical System AnalysisSf Intensity Images
Abstract We have obtained the first confocal microscopic sum frequency (SF) intensity images, using ZnS polycrystals as a sample. We have found different contrasts in the SF intensity images when the incident beams were focused at different depths in the ZnS sample. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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