IEEE Design & Test of Computers · 2006 · 32 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceMicroelectronicsVlsi DesignDependability AnalysisDevice ReliabilityDevice ScalingReliabilityReliable System DesignSemiconductor ReliabilityDevice VariabilityError ResilienceProcess Variation EffectsProcess Variation RobustnessSystem Reliability EngineeringVariability AnalysisVery-large-scale Integration (Vlsi) Design
Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.