Publication | Closed Access
Visible blind GaN <i>p-i-n</i> photodiodes
111
Citations
10
References
1998
Year
Wide-bandgap SemiconductorElectrical EngineeringElectronic DevicesOptical MaterialsEngineeringPhotodetectorsOptoelectronic MaterialsApplied PhysicsVisible BlindnessGan Power DeviceOptoelectronic DevicesThin FilmsGan P-i-n PhotodiodesCategoryiii-v SemiconductorOptoelectronicsCompound Semiconductor
We present the growth and characterization of GaN p-i-n photodiodes with a very high degree of visible blindness. The thin films were grown by low-pressure metalorganic chemical vapor deposition. The room-temperature spectral response shows a high responsivity of 0.15 A/W up until 365 nm, above which the response decreases by six orders of magnitude. Current/voltage measurements supply us with a zero bias resistance of 1011 Ω. Lastly, the temporal response shows a rise and fall time of 2.5 μs measured at zero bias. This response time is limited by the measurement circuit.
| Year | Citations | |
|---|---|---|
Page 1
Page 1